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Atomic Force Microscope LMAFM-A100

Atomic Force Microscope LMAFM-A100

Atomic Force Microscope LMAFM-A100 is a powerful and versatile microscope used in nanoscience and nanotechnology to study and manipulate matter at the atomic and molecular scale. It features an integrated design that combines the scan head and sample stage, ensuring robust anti-vibration performance. The scan resolution of the X and Y axis is 0.2nm while the Z axis comprises 0.05 nm offering exceptional resolution, precision, and the ability to study a wide range of physical and chemical interactions.

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Operation Modes Contact mode, friction mode, Tapping Mode, MFM, EFM
Scan Angle Random angle
Scan Range X/Y axis: 20×20 µm, Z axis: 2.5µm
Optical System/ Magnification Of CCD Magnification: 4x, Resolution: 2.5 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample Size Ø≤ 90 mm, H≤ 20 mm
Sample Movement 0 to 20 mm
Pulse Width of Approaching Motor 10 ± 2 ms
Scan Rate 0.6 Hz to 4.34 Hz
Scanning Control XY: 18-bit D/A & double;16-bit A/D multiple channels simultaneously
Types Of Sampling Pixel 256×256, 512×512
Feedback Type DSP digital feedback
Feedback Sampling Rate 64 kHz
PC Connections USB 2.0
Windows Software Compatible with Windows 98/2000/XP/7/8
Instrument Dimension 415 × 410 × 545 mm
Net Weight 40 kg
Gross Weight 50 kg

point.png Accommodates a wide range of sample sizes, making it versatile for various fields

point.png Equipped with a precision laser detection system, simplifying the adjustment of the laser beam for easy and straightforward operation

point.png Integrated with probe alignment device for precise adjustments and alignment

point.png Electronics are modular, facilitating straightforward maintenance and component replacement

point.png Spring-based vibration isolation is employed to ensure stable and reliable operation

point.png Delivers exceptionally accurate results, making it suitable for precise measurements and analyses

point.png Enhanced with an optical observation system allowing users to easily verify the positions of both the tip and the sample

point.png Selectable two-pixel sizes: 256×256 and 512×512 for sampling

point.png Execute scan area move and cut functions to select specific areas of interest for sampling

point.png The system begins the scanning process at random angles to ensure comprehensive data collection

point.png Adjust the laser spot detection system in real time for precision and accuracy

point.png Select and configure various color-scanning images using a palette

point.png Perform linear average and offset calibration in real time to ensure accurate sample profiling

point.png The system supports scanner sensitivity calibration and electronic controller auto-calibration

point.png Process and analyze sample images offline for in-depth examination and post-processing

It is particularly well-suited for biochemistry, enabling high-quality imaging of tissues, cells, and cellular components. Additionally, it offers excellent performance in nanotechnology, chemistry, and physics, it provides exceptional capabilities for imaging surface metal elements.

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Atomic Force Microscope LMAFM-A100