XRD Diffractometer LMXRD-B100 is a long-lasting diffractometer configured with x-ray beam for figuring out crystal structures, and detecting crystalline phases offer excellent performance. Our diffractometer ensures effective operation by providing a scanning speed range of 0.0012 ° to 50 °/min. Fitted with high-quality semiconductor array detectors, silicon drift detectors, proportional counters, and scintillation counters with a diffraction range of 225 mm
Get Quote| X-Ray Tube | Metal ceramic tube: Cu, Fe, Co, Cr, Mo, etc |
| Scanning Range | -6 to 160° |
| Scanning Speed | 0.0012° to 50°/min |
| Focus Size | 1×10 mm, 0.4×14 mm or 2×12 mm |
| Stability | ≤ 0.005 % |
| Maximum Resolving Speed | 1/10000° |
| Angle Repeatable Accuracy | 1/10000° |
| Minimal Stepping Angle | 1/10000° |
| Detector | Proportional counters (PC) or Scintillation counter (SC), Silicon drift detector (SDD), High-speed one-dimensional semiconductor array detector |
| Stability Of System Measure | ≤ 0.01 % |
| Scattered Rays Dose | 1uSv/h |
| Tube Current | 5 to 50 mA |
| Tube Voltage | 10 to 60 kV |
| Power Consumption | 2.4 kW |
| Rated Power | 3 kV |
| Goniometer Structure | Sample level (θ to θ) |
| Radius Of Diffraction | 225 mm |
| Scanning Fashion | θs/θd linkage / single action; continuous, stepping, and omg |
| 2 θ Angular Linearity | International standard sample (Si, Al203, the angle deviation of all peaks in the full spectrum is not more than ± 0.022 |
| Maximum Counting Rate of Linearity | >5×105 cps (PC, SC with the compensate function of miss counting), 15×104 (SSD), 9×102 (1D array) |
| Angle Locating Speed | 1500°/min |
| Energy Resolution Ratio | ≤25%（PC, one-dimensional array), ≤50%(SC), ≤200 eV (SDD) |
| Dimension (L×W×H) | 1000 × 800 × 1600 mm |
| 01 Box Package Dimension (L×W×H) | 1190 × 1020 × 2000 mm |
| 02 Box Package Dimension (L×W×H) | 1250 × 1035 × 1050 mm |
| Net Weight | 340 kg |
| 01 Box Gross Weight | 350 kg |
| 02 Box Gross Weight | 240 kg |
Designed with a metal-ceramic tube and a sample-level (θ to θ) goniometer structure
Featured with high-precision diffraction angle measurement for accurate outcomes
Incorporated X-ray generator control system with high-frequency, high-voltage control technology
Superior analytical capability; supports functional accessories for various tests
Operation that is programmable for easy and comfortable use
Various counting and scanning modes to meet diverse requirements
High-efficiency and reliable apparatus for both standard and specialty analyses
Mirror (Gobel) 1 quantity
XRD Diffractometer plays a crucial role in materials science, chemistry, geology, and various scientific research industries for analysing the structural properties of a wide range of materials.
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XRD Diffractometer LMXRD-B100
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