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XRD Diffractometer LMXRD-B100 scans from -6 to 160˚ at speeds ranging from 0.0012° to 50°/ minute. Incorporated with metal ceramic x-ray tube with target materials Cu, Fe, Co, Cr, Mo, etc. It is designed with an X-ray generator control system with a radius of diffraction of 225 mm. It features programmable operations, allowing for the navigation of variable parameters.
Specifications
| X-Ray Tube | Metal ceramic tube: Cu, Fe, Co, Cr, Mo, etc |
| Scanning Range | -6 to 160° |
| Scanning Speed | 0.0012° to 50°/min |
| Focus Size | 1×10 mm, 0.4×14 mm or 2×12 mm |
| Stability | ≤ 0.005 % |
| Maximum Resolving Speed | 1/10000° |
| Angle Repeatable Accuracy | 1/10000° |
| Minimal Stepping Angle | 1/10000° |
| Detector | Proportional counters (PC) or Scintillation counter (SC), Silicon drift detector (SDD), High-speed one-dimensional semiconductor array detector |
| Stability Of System Measure | ≤ 0.01 % |
| Scattered Rays Dose | 1uSv/h |
| Tube Current | 5 to 50 mA |
| Tube Voltage | 10 to 60 kV |
| Rated Power | 3 kV |
| Goniometer Structure | Sample level (θ to θ) |
| Radius Of Diffraction | 225 mm |
| Scanning Fashion | θs/θd linkage / single action; continuous, stepping, and omg |
| 2 θ Angular Linearity | International standard sample (Si, Al203, the angle deviation of all peaks in the full spectrum is not more than ± 0.022 |
| Maximum Counting Rate of Linearity | >5×105 cps (PC, SC with the compensate function of miss counting), 15×104 (SSD), 9×102 (1D array) |
| Angle Locating Speed | 1500°/min |
| Energy Resolution Ratio | ≤25%（PC, one-dimensional array), ≤50%(SC), ≤200 eV (SDD) |
| Power Consumption | 2.4 kW |
| Dimension (L×W×H) | 1000 × 800 × 1600 mm |
| 01 Box Package Dimension (L×W×H) | 1190 × 1020 × 2000 mm |
| 02 Box Package Dimension (L×W×H) | 1250 × 1035 × 1050 mm |
| Net Weight | 340 kg |
| 01 Box Gross Weight | 350 kg |
| 02 Box Gross Weight | 240 kg |
Pricing
| Product | Price | Unit | Action |
|---|---|---|---|
| XRD Diffractometer LMXRD-B100 | $ 67562.5 | Each of 1 |
Features
Offer multiple scanning methods
Equipped with goniometer at sample level
Crystallographic thermal analysis
6-position autosampler
Optional Accessories
Mirror (Gobel) 1 quantity
Applications
XRD Diffractometer plays a crucial role in materials science, chemistry, geology, and various scientific research industries for analysing the structural properties of a wide range of materials.
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$ 57400 / Each of 1
Frequently Asked Questions
1 What is an XRD Diffractometer?
An XRD Diffractometer is an apparatus designed to investigate the structure of crystalline materials.
2 How does an XRD Diffractometer work?
It utilizes X-ray diffraction to measure the angles and intensities of diffracted X-rays, enabling the determination of crystallographic structure of sample.
3 What types of samples can be analyzed using XRD diffractometer?
It can analyze a variety of samples such as metals, alloys, polymers, ceramics, minerals and pharmaceuticals.
4 Can XRD Diffractometer be used for quantitative analysis?
It is commonly used for quantitative phase analysis.
5 Can XRD Diffractometer be used for identifying unknown materials?
It is used to identify unknown crystalline materials by comparing their diffraction patterns to a database of known materials.
6 What is the difference between XRD Diffractometer and Electron Microscopy?
XRD Diffractometer provides information about the crystallographic structure of materials whereas Electron Microscopy provides detailed images of the surface morphology of sample.
7 Is XRD Diffractometer analysis affected by temperature?
Temperature influences the crystal structure and causes change in peak positions due to thermal expansion or contraction.
8 Can XRD Diffractometer be used for structural analysis of nanomaterials?
It is commonly used for analyzing nanomaterials, where peak broadening is used to estimate the nanocrystal size and identify structural defects.
9 Can XRD Diffractometer be used to study phase transitions in materials?
It is used to study phase transitions by observing changes in the diffraction pattern.
10 What is meant by Peak Deconvolution in XRD Diffractometer analysis?
It refers to the process of separating overlapping diffraction peaks to obtain accurate information about the phases and crystallographic properties of material.