Atomic Force Microscope LMAFM-A101

Atomic Force Microscope LMAFM-A101 operates based on the principle of scanning a sharp tip over a sample's surface while measuring the interaction forces between the tip and the sample to study and manipulate matter. It features an integrated design, combining the scan head and the sample stage to deliver robust anti-vibration performance. It has a scan angle of 0℃ to 360℃ while offering exceptional resolution, precision, and the ability to study a wide range of physical and chemical interactions.

Catalog

Specifications

Operation Modes	Contact mode, friction mode, extended modes of tapping phase, MFM, EFM
Scan Angle	0 to 360°
Maximum Scan Range	X/Y axis: 50 µm, Z axis: 5 µm
Optical System/ Magnification Of CCD	Magnification: 10x, Resolution: 1 µm
Resolution	X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample Size	Ø≤ 90 mm, H≤ 20 mm
Sample Movement	0 to 20 mm
Pulse Width of Approaching Motor	10 ± 2 ms
Scan Rate	0.6 Hz to 4.34 Hz
Scanning Control	XY: 18-bit D/A & double; 16-bit A/D multiple channels simultaneously
Types Of Sampling Pixel	256×256, 512×512
Feedback Type	DSP digital feedback
Feedback Sampling Rate	64 KHz
PC Connections	USB 2.0
Windows Software	Compatible with Windows 98/2000/XP/7/8
Instrument Dimension	700 × 500 × 460 mm
Net Weight	50 kg
Gross Weight	87.4 kg

Pricing

Product	Price	Unit	Action
Atomic Force Microscope LMAFM-A101	$42,504.00	Each of 1	Add to cart Buy now

Features

Accommodates a wide range of sample sizes for versatile testing and analysis
Features an optical observation system to verify the positions of the tip and the sample
Incorporates a modular electronic system for straightforward maintenance and component replacement
Utilizes a CCD observing system to enhance imaging and data acquisition
Equipped with a servomotor for achieving CCD focusing and precise manual or automatic sample-to-tip positioning
Provides exceptionally accurate results, making it suitable for precise measurements and analyses
Equipped with a precision laser detection system and a probe alignment device, simplifying laser beam adjustment for effortless operation

Applications

The system excels in providing optimal solutions for a range of applications, including biochemistry for imaging tissues, cells, and cellular components. In nanotechnology for imaging polymers and nanomaterials, and in the fields of chemistry and physics for imaging surface metal elements.

Software Features

Captures and displays multi-channel images simultaneously, enabling real-time profile map observation
Measures various curves, including F-Z, F-RMS, and RMS-Z for comprehensive data analysis
Executes move and cut functions for scan area selection, allowing users to choose areas of interest
Scans samples within a 0 to 360° angle range for complete data collection
Adjusts the laser spot detection system in real-time to maintain precision
Offers selection and configuration of different color-scanning images using a palette
Supports real-time linear average and offset calibration for accurate sample analysis
Provides calibration support for scanner sensitivity and electronic controller auto-calibration
Facilitates offline analysis and post-processing of sample images for in-depth examination and data refinement