Overview

Atomic Force Microscope LMAFM-A101 offers 50μm×50μm XY scan range. It combines optical metallographic and atomic force microscopy for simultaneous dual-mode imaging. Equipped with 2D optical and 3D atomic force measurement with strong anti-interference structure. Integrated laser head and scanning stage ensure stable performance with nanometer-level nonlinear correction. Our Microscope is ideal for high-resolution surface analysis in nanotechnology and material science.

Features :

Smart probe protection

Ultra-high magnification

Easy laser alignment

Specifications :

Operation Mode	Contact Mode, Tapping Mode, Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
Curves	RMS-Z Curve, F-Z Force Curve
XY Scan Range	50 × 50 μm
XY Scan Resolution	0.2 nm
Z Scan Range	5 μm
Z Scan Resolution	0.05 nm
Scan Speed	0.6Hz to 30Hz
Scan Angle	0° to 360°
Sample Size Capacity	Diameter less than or equal to 90 mm, Height less than or Equal to 20 mm
XY Stage Movement	25 × 25 μm
Shock-Absorbing Design	Spring Suspension, Metal Shielding Box
Output Interface	USB 2.0 / 3.0
Software Compatibility	Windows XP / 7 / 8 / 10
Dimension	700×480×450 mm
Weight	75 Kg

Applications :

Atomic Force Microscope LMAFM-A101 supports nanometer-level imaging of graphite, gold clusters, polystyrene spheres, and polysaccharides.