Infrared Grain Analyzer LMGA-A100 has been developed for analyzing real-time grain quality for detecting granular and non-uniform samples, it uses near-infrared reflection technology. Contains wavelength range of 900-1700nm automatic calibration function to achieve accuracy. Improved with high vibration resistance and portability. Detects quality identification in multiple stages such as the acquisition, storage and processing. Working parameters are easily observable on a touch-screen display with a fully functional built-in computer.
| Wavelength Range | 900-1700 nm |
| Wavelength Reproducibility | ≤ 0.02nm (standard deviation) |
| Wavelength Accuracy | less than 1nm |
| Working Temperature Range | 0-45 ℃ ambient temperature |
| Measurement Accuracy | Relative error <5% |
| Spectral Collection Rate | 3 times/second data collection |
| Spectral Resolution | ≤ 16 nm |
| Scanning Area | Sample disk area should not be less than 250ml |
| Analysis Time | ≤ 3 minutes |
| Baseline Stability | ≤ 0.00005AU |
| Data Sampling Interval Time | ≤ 0.008 seconds |
| Detector | InGaAs indium gallium arsenic single point detector |
| Dimension | 278×337×292 mm |
| Weight | 7 kg |
It is widely used in research areas, food and agricultural fields. It is suitable for soybeans, rapeseed, wheat, barley, corn, rice, sorghum, rice, husks, etc
